Low overhead design-for-testability for scan-based delay fault testing
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论文摘要: | Low overhead design-for-testability for scan-based delay fault testing摘要 摘要需要准确、简洁、清晰和完整地概括论文的主题、目的、方法、结果和结论,以便可以快速了解论文的核心内容。本文论述了Low overhead design-for-testability for scan-based delay fault testing在当前一些问题,了解论文Low overhead design-for-testability for scan-based delay fault testing背景,本文从论文角度/方向/领域进行关于Low overhead design-for-testability for scan-based delay fault testing的研究; 针对Low overhead design-for-testability for scan-based delay fault testing问题/现象,从Low overhead design-for-testability for scan-based delay fault testing方面,利用Low overhead design-for-testability for scan-based delay fault testing方法进行研究。目的: 研究Low overhead design-for-testability for scan-based delay fault testing目的、范围、重要性;方法: 采用Low overhead design-for-testability for scan-based delay fault testing手段和方法;结果: 完成了Low overhead design-for-testability for scan-based delay fault testing工作取得的数据和结果; 结论: 得出Low overhead design-for-testability for scan-based delay fault testing的重要结论及主要观点,论文的新见解。 [关键词]:Low ;Low over;esting |
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论文目录: | Low overhead design-for-testability for scan-based delay fault testing目录(参考) 中文摘要(参考) 英文摘要Abstract 论文目录 第一章 引言/绪论…………………1 1.1 Low overhead design-for-testability for scan-based delay fault testing研究背景…………………2 1.2 Low overhead design-for-testability for scan-based delay fault testing研究意义…………………2 1.3 Low overhead design-for-testability for scan-based delay fault testing国内外研究现状…………………2 1.3.1 国外研究现状…………………2 1.3.2 国内研究现状…………………2 1.4 Low overhead design-for-testability for scan-based delay fault testing文献综述…………………2 1.4.1 国外研究现状…………………2 1.4.2 国内研究现状…………………2 1.5 Low overhead design-for-testability for scan-based delay fault testing研究的目的和内容…………………3 1.5.1 研究目的…………………3 1.5.2 研究内容…………………3 1.6 Low overhead design-for-testability for scan-based delay fault testing研究的方法及技术路线…………………3 1.6.1 研究方法…………………3 1.6.2 研究技术路线…………………3 1.7 Low overhead design-for-testability for scan-based delay fault testing拟解决的关键问题…………………3 1.8 Low overhead design-for-testability for scan-based delay fault testing创新性/创新点…………………3 1.9 Low overhead design-for-testability for scan-based delay fault testing本章小结…………………3 第二章 Low overhead design-for-testability for scan-based delay fault testing基本概念和理论…………………4 2.1 Low overhead design-for-testability for scan-based delay fault testing的定义和性质…………………4 2.2 Low overhead design-for-testability for scan-based delay fault testing的分类和体系…………………4 2.3 Low overhead design-for-testability for scan-based delay fault testing的研究方法…………………5 2.4 Low overhead design-for-testability for scan-based delay fault testing的基本理论…………………5 第三章 Low overhead design-for-testability for scan-based delay fault testing的构成要素/关键技术…………………6 3.1 Low overhead design-for-testability for scan-based delay fault testing的组成部分…………………6 3.2 Low overhead design-for-testability for scan-based delay fault testing的功能模块…………………6 3.3 Low overhead design-for-testability for scan-based delay fault testing的内容支持…………………7 第四章 Low overhead design-for-testability for scan-based delay fault testing的案例分析/应用领域……………… 8 4.1 Low overhead design-for-testability for scan-based delay fault testing问案例分析……………………………………… 9 4.2 Low overhead design-for-testability for scan-based delay fault testing的数据分析………………………………9 4.3 Low overhead design-for-testability for scan-based delay fault testing研究策略 ………………………………………10 4.4 本章小结 ………………………………………………10 第五章 Low overhead design-for-testability for scan-based delay fault testing的设计、评价与优化………………………10 5.1 Low overhead design-for-testability for scan-based delay fault testing的解决措施 …… ………… 11 5.2 Low overhead design-for-testability for scan-based delay fault testing的评价 ………………… 12 5.3 Low overhead design-for-testability for scan-based delay fault testing的优化 …………………… 13 5.4 本章小结 ………… ………… 13 第六章 Low overhead design-for-testability for scan-based delay fault testing的经验总结与启示………………………15 6.1 Low overhead design-for-testability for scan-based delay fault testing经验总结…………………15 6.2 Low overhead design-for-testability for scan-based delay fault testing研究启示……………………16 6.3 Low overhead design-for-testability for scan-based delay fault testing未来发展趋势…………………… 16 6.4 Low overhead design-for-testability for scan-based delay fault testing本章小结…………………… 16 第七章 Low overhead design-for-testability for scan-based delay fault testing总结结论与建议………17 7.1 结论概括……………17 7.2 根据结论提出建议……………17 7.3 本章小结……………17 第八章 Low overhead design-for-testability for scan-based delay fault testing结论与展望/结束语……………………………23 8.1 研究成果总结……………………………23 8.2 存在问题及改进方向……………………………23 8.3 未来发展趋势……………………………23 致谢 ………………………………………24 参考文献 ……………………………………… 25 论文注释 ………………………………………26 附录 …………………………………………27 |
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参考文献: | Low overhead design-for-testability for scan-based delay fault testing参考文献类型:专著[M],论文集[C],报纸文章[N],期刊文章[J],学位论文[D],报告[R],标准[S],专利[P],论文集中的析出文献[A] |
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论文致谢: | 六月的校园总是让人无法宁静,收获的喜悦、离别的伤感、远行前的驻足与徘徊、叹时光之流逝、思人生之深浅。转眼间三年的研究生生活即将结束,不仅仅是时光的流逝,回首,自己成长了很多。有我的拼搏努力,更离不开身边老师、同学、朋友的支持与帮助。 |
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文献综述结构: | Low overhead design-for-testability for scan-based delay fault testing文献综述参考 |
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论文编号: | 2967022 | ||
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